Industrial and Intellectual Property

  • Imaging techniques and scanning electron microscopy as tools for characterizing a Si-based material used in air monitoring applications [2016]

    Category:
    Artículos
    Authors:
    Leonor Castrillón Peláez , Beatriz Suárez Peña , Laura Megido Fernández , María Elena Marañón Maison , Yolanda Fernández Nava , Luis Negral Álvarez
    Date:
    01 of January of 2016
    It Is a Part of:
    Materials